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Volumn 408, Issue 1-2, 2002, Pages 79-86

Porous thin films for the characterization of atomic force microscope tip morphology

Author keywords

Atomic force microscopy; Physical vapour deposition; Surface morphology; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHROMIUM; EVAPORATION; METALLIC FILMS; MORPHOLOGY; PHYSICAL VAPOR DEPOSITION; POROSITY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; TITANIUM; WEAR OF MATERIALS;

EID: 0037012493     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00142-6     Document Type: Article
Times cited : (8)

References (47)
  • 24
    • 0008876428 scopus 로고    scopus 로고


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.