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Volumn 384, Issue 6605, 1996, Pages 147-150
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Nanotubes as nanoprobes in scanning probe microscopy
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
GRAPHITE;
NANOPARTICLE;
SILICON;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
ELECTRIC CONDUCTIVITY;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
SCANNING FORCE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
YOUNG MODULUS;
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EID: 0029911943
PISSN: 00280836
EISSN: None
Source Type: Journal
DOI: 10.1038/384147a0 Document Type: Article |
Times cited : (2241)
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References (0)
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