Computer simulation of the AFM/LFM imaging process: Hexagonal versus honeycomb structure on graphite

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 620-625

  Von Toussaint, U ^a   Schimmel, Th ^a   Kuppers J ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

Atomic force microscopy lateral force microscopy (AFM LFM); Atomic resolution; Atomic scale friction; Computer simulation; Highly oriented pyrolytic graphite (HOPG); Stick slip processes

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTAL ORIENTATION; FRICTION; IMAGING TECHNIQUES;

ATOMIC SCALE FRICTION; LATERAL FORCE MICROSCOPY (LFM); STICK SLIP PROCESS;

GRAPHITE;

EID: 0031152322     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<620::aid-sia288>3.0.co;2-z     Document Type: Article

References (20)

1. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40, 188 (1982).
2. G. Binnig, C. F. Quate and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1982).
3. G. Meyer and N. M. Amer, Appl. Phys. Lett. 56(21), 2100 (1990).
4. G. Binnig, H. Fuchs, Ch. Gerber, H. Rohrer, E. Stoll and E. Tosatti, Europhys. Lett. 1, 31 (1986).
5. Sang-il Park and C. F. Quate, Appl. Phys. Lett. 48, 112 (1986).
6. C. Binnig, C. Gerber, E. Stoll, T. R. Albrecht and C. F. Quate, Europhys. Lett. 3, 1281 (1987).
7. E. Meyer, H. Heinzelmann, P. Grütter, T. Jung, T. Weisskopf, H.-R. Hidber, R. Lapka, H. Rudin and H.-J. Güntherodt, J. Microsc. 152, 269 (1988).
8. O. Marti, B. Drake, S. Gould and P. K. Hansma, J. Vac. Sci. Technol. A 6, 287 (1988).
9. P. J. Bryant, R. G. Miller and R. Yang, Appl. Phys. Lett. 52, 2233 (1988).
10. I. B. Batra, N. Garcia, H. Rohrer, H. Salemink, E. Stoll and S. Ciraci, Surf. Sci. 181, 126 (1987).
11. D. Tománek, S. G. Louie, H. J. Marmin, D. W. Abraham, R. E. Thomson, E. Ganz and J. Clark, Phys. Rev. B 35, 7790 (1987).
12. D. Tománek and S. G. Louie, Phys. Rev. B 37, 8327 (1988).
13. J. Tersoff, Phys. Rev. Lett. 57, 440 (1986).
14. C. M. Mate, G. M. McClelland, R. Erlandsson and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
15. R. Emch, J. Nogami, M. M. Dovek, C. A. Lang and C. F. Quate, J. Microsc. 152, 129 (1988).
16. Th. Schimmel, R. Kemnitzer, J. Küppers, Ch. Kloc and M. Lux-Steiner, in Forces in Scanning Probe Methods, ed. by H.-J. Güntherordt, et al., pp. 513-518. Kluwer Academic, Dordrecht (1995).
17. S. Fujisawa, M. Ohta, T. Konishi, Y. Sugawara and S. Morita, Rev. Sci Instrum., 65(3), 633 (1994).
18. U. D. Schwarz, H. Bluhm, H. Hölscher, W. Allers and R. Wiesendanger, in The Physics of Sliding Friction, ed. by B. N. J. Persson and E. Tosatti, pp. 369-402. Kluwer Academic, Dordrecht (1996).
19. Th. Schimmel, K. Friemelt, J. Küppers and M. Lux-Steiner, in Forces in Scanning Probe Methods, ed by H.-J. Güntherodt, et al., p. 525. Kluwer Academic, Dordrecht (1995).
20. V. J. Cee, D. L. Patrick and T. P. Beebe, Surf. Sci. 329 141 (1995).