Elastic deformations of tip and sample during atomic force microscope measurements

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1250-1254

  Heuberger, Manfred ^a   Dietler, Giovanni ^b   Schlapbach, Louis ^b  

^a University of California   (United States)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000459365     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588525     Document Type: Article

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