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Volumn 15, Issue 19, 1999, Pages 6522-6526

Organic and inorganic contamination on commercial AFM cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; GOLD; HYDROGEN PEROXIDE; MASS SPECTROMETRY; SILICONES; SULFURIC ACID; SURFACE STRUCTURE; THERMAL DIFFUSION IN SOLIDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032661215     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990371x     Document Type: Article
Times cited : (127)

References (34)
  • 5
    • 0345435492 scopus 로고    scopus 로고
    • note
    • The major AFM cantilever manufacturers include Park Scientific Instruments, TopoMetrix, Digital Instruments, Olympus, and others. (It is our understanding that Park Scientific Instruments and TopoMetrix have merged into ThermoMicroscopes.)
  • 31
    • 0344573299 scopus 로고
    • Mark, H. F., Bikales, N. M., Overberger, C. G., Menges, G., Eds.; John Wiley & Sons: New York
    • Owen, M. J. Encyclopedia of Polymer Science and Engineering, 2nd ed.; Mark, H. F., Bikales, N. M., Overberger, C. G., Menges, G., Eds.; John Wiley & Sons: New York, 1985; Vol. 14, pp 411-420.
    • (1985) Encyclopedia of Polymer Science and Engineering, 2nd Ed. , vol.14 , pp. 411-420
    • Owen, M.J.1
  • 32
    • 0007641390 scopus 로고    scopus 로고
    • Salamone, J. C., Ed.; CRC Press: Boca Raton, FL
    • Owen, M. J.; Jones, J. D. Polymeric Materials Encyclopedia; Salamone, J. C., Ed.; CRC Press: Boca Raton, FL, 1996; Vol. 10, pp 7688-7694.
    • (1996) Polymeric Materials Encyclopedia , vol.10 , pp. 7688-7694
    • Owen, M.J.1    Jones, J.D.2
  • 34
    • 0344573308 scopus 로고    scopus 로고
    • note
    • i) was used for the calculation of the atomic concentration ratio of the species on surfaces. C, I, and S represent the atomic concentration, XPS intensity, and XPS sensitivity factor, respectively. S values used with the ESCALAB 220i-XL are as follows: C 1s, 1.00; N 1s, 1.80; O 1s, 2.93; Si 2s, 0.95; Au 4f, 17.12.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.