High-yield assembly of individual single-walled carbon nanotube tips for scanning probe microscopies

Journal of Physical Chemistry B

Volumn 105, Issue 4, 2001, Pages 745-746

  Hafner, Jason H ^a   Cheung, Chin Li ^a   Oosterkamp, Tjerk H ^a   Lieber, Charles M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES;

CARBON NANOTUBES; SCANNING PROBE MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWNT);

NANOSTRUCTURED MATERIALS;

EID: 0034819152     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp003948o     Document Type: Article

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