Surface imaging of fragile materials with hydrophobic atomic force microscope tips

Surface Science

Volumn 467, Issue 1-3, 2000, Pages 185-190

  Wei, Z Q ^a   Wang, C ^a   Bai, C L ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPILLARITY; CHEMISORPTION; FRICTION; HYDROPHOBICITY; INTERFACES (MATERIALS); MONOLAYERS; MORPHOLOGY; SILANES; SURFACE ROUGHNESS; SURFACE TREATMENT;

OCTADECYLTRICHLOROSILANE; SELF ASSEMBLED MONOLAYERS (SAM);

SILICON NITRIDE;

EID: 0034320798     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00783-4     Document Type: Article

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