Can atomic force microscopy achieve atomic resolution in contact mode?

Physical Review Letters

Volumn 86, Issue 7, 2001, Pages 1287-1290

  Jarvis, M R ^a   Pérez, Rubén ^b   Payne, M C ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; COMPUTER SIMULATION; DIAMONDS; MOLECULAR DYNAMICS; QUANTUM THEORY; SURFACE STRUCTURE; VAN DER WAALS FORCES;

ATOMIC RESOLUTION; CONTACT MODE;

ATOMIC FORCE MICROSCOPY;

EID: 14344279880     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.1287     Document Type: Article

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