Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints

Review of Scientific Instruments

Volumn 73, Issue 6, 2002, Pages 2305-

  Kindt, Johannes H ^a   Thompson, James B ^a   Viani, Mario B ^a   Hansma, Paul K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

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EID: 0036609537     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1475352     Document Type: Article

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