Improved atomic force microscopy resolution using an electric double layer

Applied Physics Letters

Volumn 70, Issue 7, 1997, Pages 844-846

  Sokolov, I Yu ^a   Henderson, G S ^a   Wicks, F J ^b   Ozin, G A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b DEPARTMENT OF NATURAL HISTORY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001595839     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118221     Document Type: Article

References (12)

1. T. J. Senden, C. J. Drummond, and P. Kekicheff, Langmuir 10, 358 (1994).
2. S. Manne, J. P. Cleveland, H. E. Gaub, G. D. Stucky, and P. K. Hansma, Langmuir 10, 4409 (1994).
3. S. Manne and H. E. Gaub, Science 270, 1480 (1995).
4. A. L. Weisenhom, P. K. Hansma, T. R. Albrecht, and F. Quate, Appl. Phys. Lett. 54, 2651 (1989).
5. J. L. Hutter and J. Bechhoefer, J. Appl. Phys. 73, 4123 (1993).
6. S. A. Joyce and J. E. Houston, Rev. Sci. Instrum. 62, 710 (1991).
7. G. A. Vrdoljak, G. S. Henderson, J. J. Fawcett, and F. J. Wicks, Am. Mineral. 79, 107 (1994).
8. I. Yu. Sokolov, Surf. Sci. 311, 287 (1994).
9. V. M. Mostepanenko, V. I. Panov, and I. Yu. Sokolov, Sov. Tech. Phys. Lett. 19, 251 (1993).
10. Yu. N. Moiseev, V. M. Mostepanenko, V. I. Panov, and I. Yu. Sokolov, Phys. Lett. A 132, 354 (1988).
11. H. Krupp, W. Schovabel, and G. Walfer, J. Colloid Interface Sci. 39, 421 (1972).
12. J. N. Israelachvili, Intermolecular and Surface Forces, 2nd ed. (Academic, San Diego, 1991).