Atomic resolution imaging using the electric double layer technique: Friction vs. height contrast mechanisms

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 302-307

  Sokolov, I Yu ^a   Henderson, G S ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; IMAGE RECORDING; IMAGING TECHNIQUES; SCANNING;

ELECTRIC DOUBLE LAYERS (EDL);

ATOMIC FORCE MICROSCOPY;

EID: 0033743622     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00543-7     Document Type: Article

References (4)

1. Sokolov I.Yu., Henderson G.S., Wicks F.J. Applied Physics Letters. 70:1997;844.
2. Sokolov I.Yu., Henderson G.S., Wicks F.J. Journal of Applied Physics. 86:1999;5537.
3. Morita S., Fujisawa S., Sugawara Y. Surface Science Reports. 23:1996;1.
4. Ohnesorge F., Binnig G. Science. 260:1993;1451.