SCOPUS 정보 검색 플랫폼

Volumn 433-435, Issue , 1999, Pages 627-631

Simultaneous observation of scanning tunneling microscopy and reflection electron microscopy image of the Si(111)7 × 7 surface

(4) Naitoh, Yoshitaka a Takayanagi, Kunio a Hirayama, Hiroyuki a Ohsima, Yoshifumi a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Electron microscopy; Scanning tunneling microscopy; Silicon; Tungsten; Tunneling

Indexed keywords

ATOMS; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPY; ELECTRON TUNNELING; IMAGE ANALYSIS; MIRRORS; REFLECTION; SCANNING TUNNELING MICROSCOPY; SURFACES; TUNGSTEN;

ATOMIC STRUCTURE; REFLECTION ELECTRON MICROSCOPY; SPECULAR BEAM REFLECTION; ULTRAHIGH VACUUM ELECTRON MICROSCOPE;

SEMICONDUCTING SILICON;

EID: 0033334951 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00479-3 Document Type: Article

Times cited : (9)

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