Imaging artefacts in atomic force microscopy with carbon nanotube tips

Nanotechnology

Volumn 16, Issue 11, 2005, Pages 2482-2492

  Strus, M C ^a   Raman, A ^a   Han, C S ^b   Nguyen, C V ^c  

^a PURDUE UNIVERSITY   (United States)

^b Korea Institute of Machine and Materials   (South Korea)

^c NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; DIFFRACTION GRATINGS; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR MATERIALS; SILICA; SURFACES; TUNGSTEN;

ARTEFACTS; DYNAMIC ATOMIC FORCE MICROSCOPY; MICROCANTILEVERS; SEMICONDUCTOR SURFACES;

ATOMIC FORCE MICROSCOPY;

EID: 26644457896     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/11/003     Document Type: Article

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