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Volumn 3, Issue 3, 1997, Pages 203-213

Examination of atomic (scanning) force microscopy probe tips with the transmission electron microscope

Author keywords

Atomic force microscopy; Probe; Scanning force microscopy; Sharpness; Tip; Transmission electron microscope

Indexed keywords


EID: 0031495010     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s143192769797015x     Document Type: Article
Times cited : (36)

References (34)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.