Revealing the hidden atom in graphite by low-temperature atomic force microscopy

Proceedings of the National Academy of Sciences of the United States of America

Volumn 100, Issue 22, 2003, Pages 12539-12542

  Hembacher, Stefan ^a   Giessibl, Franz J ^a   Mannhart, Jochen ^a   Quate, Calvin F ^b  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIAMOND; FULLERENE; GRAPHITE; PYROLYTIC CARBON;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CALIBRATION; CRYSTAL STRUCTURE; DIFFRACTION; IMAGING; LOW TEMPERATURE ATOMIC FORCE MICROSCOPY; LOW TEMPERATURE PROCEDURES; NEUTRON SCATTERING; PRIORITY JOURNAL; REFERENCE VALUE; SCANNING ELECTRON MICROSCOPY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; X RAY CRYSTALLOGRAPHY;

FREEZING; GRAPHITE; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; SENSITIVITY AND SPECIFICITY;

EID: 0242363188     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.2134173100     Document Type: Article

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