Lattice-resolution imaging of the sapphire (0 0 0 1) surface in air by AFM

Surface Science

Volumn 601, Issue 4, 2007, Pages 1064-1071

  Gan, Yang ^a   Wanless, Erica J ^b   Franks, George V ^c  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Aluminum oxide; Atomic Force Microscopy; Resolution; Stepped single crystal surfaces; Surface structure, morphology, roughness, and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; IMAGING SYSTEMS; OPTICAL RESOLVING POWER; SAPPHIRE; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

ALUMINUM OXIDES; CONTACT FORCE; STEPPED SINGLE-CRYSTAL SURFACES;

SURFACE STRUCTURE;

EID: 33846785468     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.057     Document Type: Article

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