Analyzing atomic force microscopy images using spectral methods

Journal of Applied Physics

Volumn 82, Issue 12, 1997, Pages 5891-5898

  Fang, S J ^a,b   Haplepete, S ^a   Chen, W ^a,c   Helms, C R ^a   Edwards, Hal ^b  

^a Stanford University   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000963652     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366489     Document Type: Article

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38. Terminology of AFM operation varies from vendors to vendors. In this work, we simply adopted the terminology used by Digital Instruments.