Imitation of non-contact mode while scanning in the presence of an electric double layer?

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 422-427

  Sokolov, I Yu ^a   Henderson, G S ^a   Wicks, F J ^a,b  

^a UNIVERSITY OF TORONTO   (Canada)

^b DEPARTMENT OF NATURAL HISTORY   (Canada)

Author keywords

07.79.L; 34.20; 61.16.C; APN; Atomic force microscopy; Molecular force interaction; True atomic resolution

Indexed keywords

EID: 0012247255     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00568-6     Document Type: Article

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