A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy

Nanotechnology

Volumn 18, Issue 3, 2007, Pages

  Das, Soma ^a   Sreeram, P A ^a   Raychaudhuri, A K ^a  

^a S N BOSE NATIONAL CENTRE FOR BASIC SCIENCES   (India)

Author keywords

[No Author keywords available]

Indexed keywords

METALLIC FILMS; MICA; SILICON; SILVER; SPRINGS (COMPONENTS); VAN DER WAALS FORCES;

HAMAKER CONSTANT; JUMP-INTO-CONTACT EFFECT; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY;

EID: 33846805961     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/3/035501     Document Type: Article

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