Intricate stepline artifact can mimic true atomic resolution in atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 8, 2000, Pages R5121-R5124

  Ohnesorge, F ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001627040     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.R5121     Document Type: Article

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