Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Nie, H Y ^a   McIntyre, N S ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTAMINATION; GOLD; SILICON; SURFACE PROPERTIES;

DECANETHIOLS; DYNAMIC FORCE MODES; PROBE TIPS;

SULFUR COMPOUNDS;

EID: 33847685189     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2437196     Document Type: Article

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