Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam

Nanotechnology

Volumn 16, Issue 11, 2005, Pages 2493-2496

  Martinez, J ^a   Yuzvinsky, T D ^a   Fennimore, A M ^a   Zettl, A ^b   Garcia R ^c   Bustamante, C ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DNA; ELECTRON BEAMS; METAL FOIL; SCANNING ELECTRON MICROSCOPY;

DNA MOLECULES; NANOMANIPULATORS; NANOTUBE LENGTH;

CARBON NANOTUBES;

EID: 26444552041     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/11/004     Document Type: Article

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