Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images

Microscopy Research and Technique

Volumn 44, Issue 5, 1999, Pages 312-326

  Taatjes, Douglas J ^a   Quinn, Anthony S ^a   Lewis, Michael R ^a   Bovill, Edwin G ^a  

^a UNIVERSITY OF VERMONT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTRONS; GOLD NANOPARTICLES; IMAGE QUALITY; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE;

ATOMIC FORCE; ATOMIC-FORCE-MICROSCOPY; CONFOCAL LASER SCANNING MICROSCOPE; ELECTRON-BEAM; LIGHT MICROSCOPES; QUALITY ASSESSMENT; RENDERED IMAGES; SCANNING ELECTRONS; SCANNING PROBES; TIP STRUCTURE;

ELECTRON BEAMS;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRON BEAM; IMAGE ANALYSIS; IMAGE QUALITY; MICROSCOPE IMAGE; MOLECULAR BIOLOGY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0033104775     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19990301)44:5<312::AID-JEMT2>3.0.CO;2-P     Document Type: Article

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