Blind restoration method of scanning tunneling and atomic force microscopy images

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1552-1556

  Dongmo, Samuel ^a   Troyon, Michel ^a   Vautrot, Philippe ^a   Delain, Etienne ^b   Bonnet, Noél ^a  

^a INSERM   (France)

^b INSTITUT GUSTAVE ROUSSY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001365643     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589137     Document Type: Article

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