Imaging the Dimers in Si\(111\)-\(7 × 7\)

Physical Review Letters

Volumn 77, Issue 20, 1996, Pages 4226-4228

  Bengu, E ^a   Plass, R ^a   Marks, L D ^a   Ichihashi, T ^b   Ajayan, P M ^b   Iijima, S ^b  

^a Northwestern University   (United States)

^b NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000883843     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.4226     Document Type: Article

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