Studies of tip wear processes in tapping mode™ atomic force microscopy

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 135-144

  Su, Chanmin ^a   Huang, Lin ^a   Kjoller, Kevin ^a   Babcock, Ken ^a  

^a Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; SURFACE CHEMISTRY; SURFACE ROUGHNESS; TITANIUM; WEAR OF MATERIALS;

IMAGE RESOLUTION;

ATOMIC FORCE MICROSCOPY;

TITANIUM;

ANALYTICAL PARAMETERS; ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; CHEMICAL ANALYSIS; CHEMICAL PARAMETERS; ERROR; HARDNESS; HISTOGRAM; MONITORING; OSCILLATION; PHYSICAL CHEMISTRY; QUALITATIVE ANALYSIS; STRUCTURE ANALYSIS; SURFACE PROPERTY; VELOCITY;

EID: 0038203466     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00038-X     Document Type: Article

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