Measurement of double-layer forces at the electrode/electrolyte interface using the atomic force microscope: Potential and anion dependent interactions

Journal of Physical Chemistry

Volumn 100, Issue 48, 1996, Pages 18808-18817

  Hillier, Andrew C ^a   Kirn, Sunghyun ^b   Bard, Allen J ^c  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b University of Virginia   (United States)

^c Konkuk University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751030356     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp961629k     Document Type: Article

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