Carbon nanotubes as tips in non-contact SFM

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 269-273

  Barwich, V ^a   Bammerlin, M ^a   Baratoff, A ^a   Bennewitz, R ^a   Guggisberg, M ^a   Loppacher, C ^a   Pfeiffer, O ^a   Meyer, E ^a   Guntherodt H J ^a   Salvetat, J P ^b   Bonard, J M ^b   Forro L ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COPPER; MICROSCOPIC EXAMINATION; SILICON; SODIUM CHLORIDE; SURFACE TOPOGRAPHY;

NONCONTACT ATOMIC FORCE MICROSCOPY; SCANNING FORCE MICROSCOPY;

NANOTUBES;

EID: 0033733381     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00538-3     Document Type: Article

References (14)

1. Kizuka T. Phys. Rev. B. 59:1999;4646.
2. Buongiorno M., Yakobson B.I., Bernholc J. Phys. Rev. Lett. 81:1998;4656.
3. M.S. Dresselhaus, APS Tutorial, Carbon Nanotubes (1998).
4. Wong E.W., Sheehan P.E., Lieber C.M. Science. 277:1997;1971.
5. Salvetat J.-P., Briggs G.A.D., Bonard J.-M., Bacsa R.R., Kulik A.J., Stöckli T., Burnham N.A., Forró L. Phys. Rev. Lett. 82:1999;944.
6. Dai H., Hafner J.H., Rinzler A.G., Colbert D.T., Smalley R. Nature. 384:1996;147.
7. J.-P. Salvetat, J.-M. Bonard, L. Forró, Ecole Polytechnique Fédérale de Lausanne, DP, Institut de Génie Atomique, 1015 Lausanne, Switzerland.
8. Maser W., Lambert J.M., Ajayan P.M., Stephan O., Bernier P. Synth. Met. 77:1996;243.
9. Iijima S. Nature. 354:1991;56.
10. Hafner J.H., Bronikowski M.J., Azamian B.R., Nikolaev P., Rinzler A.G., Colbert D.T., Smith K.A., Smalley R.E. Chem. Phys. Lett. 296:1998;195.
11. The mounting process is described in detail on the internet page http://cnst.rice.edu/mount.html .
12. Howald L., Meyer E., Lüthi R., Haefke H., Overney R., Rudin H., Günterodt H.-J. Appl. Phys. Lett. 63:1993;117.
13. Nanosensors, Dr. Olaf Wolter GmbH, IMO Building, Im Amtinann 6, D-35578 Wetzlar, Germany, http://www.nanosensors.com.
14. Giessibl F.J. Phys. Rev. B. 56:1997;16010.