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Volumn 80, Issue 11, 1996, Pages 6081-6090
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Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000440491
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.363680 Document Type: Article |
Times cited : (173)
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References (19)
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