True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes

Applied Physics Letters

Volumn 84, Issue 14, 2004, Pages 2697-2699

  Klinov, Dmitry ^a   Magonov, Sergei ^b  

^a SHEMYAKIN OVCHINNIKOV INSTITUTE OF BIOORGANIC CHEMISTRY   (Russian Federation)

^b VEECO INSTRUMENTS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SURFACE; MOLECULAR-SIZE DEFECTS; SURFACE CONTAMINATION; TAPPING MODE (TP);

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; CRYSTALLOGRAPHY; FAST FOURIER TRANSFORMS; FREQUENCY MODULATION; OPTICAL FILTERS; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL ATOMIC STRUCTURE;

EID: 2342624530     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1697629     Document Type: Article

References (22)

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