Analytical transmission electron microscopy

Annual Review of Materials Research

Volumn 35, Issue , 2005, Pages 239-314

  Sigle, Wilfried ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

EDXS; EELS; Electron scattering; Electron spectroscopy; Energy filtered TEM

Indexed keywords

DATA ACQUISITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ENERGY DISSIPATION; OPTICAL RESOLVING POWER;

EDXS; ENERGY FILTERED TEM; MATERIAL SYSTEMS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 24944474406     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.35.102303.091623     Document Type: Review

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