Local optical properties, electron densities, and london dispersion energies of atomically structured grain boundaries

Physical Review Letters

Volumn 93, Issue 22, 2004, Pages

  Van Benthem, Klaus ^a,e   Tan, Guolong ^b   Denoyer, Linda K ^c   French, Roger H ^b,d   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c Deconvolution and Entropy Consulting   (United States)

^d DUPONT COMPANY   (United States)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); INTERFACE ENERGIES; LONDON DISPERSION ENERGIES; STRUCTURED INTERFACES;

ELECTRODYNAMICS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; INTERFACES (MATERIALS); IRON; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

CARRIER CONCENTRATION;

EID: 42749103666     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.227201     Document Type: Article

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