Plasmon energy mapping in energy-filtering transmission electron microscopy

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 565-571

  Sigle, W ^a   Kramer S ^a,c   Varshney, V ^b   Zern, A ^a,d   Eigenthaler, U ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^c University of California   (United States)

^d BALLUFF GMBH   (Germany)

Author keywords

Energy filtering TEM; Isochromaticity; Plasmon mapping

Indexed keywords

CERAMIC MATERIALS; COMPOSITION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; SILICON CARBIDE;

PLASMON ENERGY MAPPING;

TRANSMISSION ELECTRON MICROSCOPY;

BORON; CARBON; NITROGEN; SILICON;

CERAMICS; CHEMICAL COMPOSITION; COLORIMETRY; CONFERENCE PAPER; CRYSTAL; ENERGY; FILM; FILTER; MATERIALS; PLASMON ENERGY MAPPING; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0038501999     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00117-7     Document Type: Conference Paper

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