Electron-energy-loss spectroscopy studies of Cu-α-Al2O3 interfaces grown by molecular beam epitaxy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 78, Issue 2, 1998, Pages 439-465

  Scheu, C ^a,c   Dehm, G ^a,c   Ruhle M ^a   Brydson, R ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032147720     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619808241913     Document Type: Article

References (60)

1. Alemany, P., Boorse, R. S., Burlitch, J. M., and Hoffman, R., 1993, J. phys. Chem. 97, 8464.
2. Anderson, A. B., Ravimohan, C., and Mehandru, S. P., 1987, Surf. Sei., 183, 438.
3. Brown, L. M., 1993, Nature, 366, 721.
4. Browning, N. D., Chisholm, M. F., and Pennycook, S. J., 1993, Nature, 366, 143.
5. Bruley, J., Brydson, R., Müllejans, H., Mayer, J., Gutekunst, G., Mader, W., Knauss, D., and Rühle, M., 1994, J. Mater. Res. 9, 2574.
6. Bruley, J., Keast, V. J., and Williams, D. B., 1996, J. appl. Phys. 29, 1730.
7. Brydson, R., 1991, EMSA Bull. 21, 57.
8. Brydson, R., 1995, J. Micros., 180, 238.
9. Brydson, R., 1996, J. appl. Phys. D, 29, 1699.
10. Brydson, R., Müllejans, H., Bruley, J., Trusty, P., Sun, X., Yeomans, J., and Rühle, M., 1995, J. Microsc., 3, 369.
11. Brydson, R., Sauer, H., and Engel, W., 1992a, in Applications of Transmission Electron Energy-Loss Spectroscopy in Materials Science, edited by M. M. Disko, C. C. Ahn and B. Fultz (Warrendale, Pennsylvania: Metallurgical Society of AIME). Chapter 6.
12. Brydson, R., Sauer, H., Engel, W., and Hofer, F., 1992b, J. Phys.: condens. Matter, 4, 3429.
13. Brydson, R., Vvedensky, D. D., Engel, W., Sauer, H., Williams, B. G., Zeitler, E., and Thomas, J. M., 1988, J. phys. Chem., 92, 962.
14. Brytov, L. A., and Romaschenko, Y. N., 1978, Soviet Phys. solid St., 20, 384.
15. Chang, C. C., 1971, J. vac. Sei. Technol., 8, 500.
16. de Groot, F. M. F., Fuggle, J. C., Thole, B. T., and Sawatzky, G. A., 1990, Phvs. Rev. B, 41,928.
17. de Groot, F. M. F., Grioni, M., Fuggle, J. C, Ghijsen, J., Sawatzky, G. A., and Petersen, H., 1989, Phys. Rev. B, 40, 5715.
18. Dehm, G., Rühle, M., Ding, G., and Raj, R., 1995, Phil. Mag. B, 71, 1111.
19. Dehm, G., Scheu, C., Möbus, G., Brydson R., and Rühle, M., 1997, Ultramicroscopy, 67, 207.
20. Durham, P. J., Pendry, J. B., and Hodges, C. H., 1982, Comput. Phys. Commun., 25, 193.
21. Eckardt, H., Fritsche, L., and Noffke, J., 1984, J. Phys. F, 14, 97.
22. Egerton, R. F., 1986, Electron Energy-Loss Spectroscopy in the Electron Microscope (New York: Plenum).
23. Gautier, M., Durand, J. P., and Van, L. P., 1991, Surf. Sei. Lett., 249 L327.
24. Gautier, M., Van, L. P., and Durand, J. P., 1992, Europhys. Lett., 18, 75.
25. Gota, S., Gautier, M., Douillard, L., Durand, J. P., and Fevre, P. L., 1996, Surf. Sei., 352, 1016.
26. Guo, Q., and Möller, P. J., 1991a, Surf. Sei., 244, 228.
27. Guo, Q., and Möller, P. J., 1991b, Thin Solid Films, 201, 267.
28. Hansen, P. L., Brydson, R., McComb, D. W., and Richardson, I. G., 1995, Microsc. Microanal. Microstruct., 5, 173.
29. Herman, F., and Skillman, S., 1963, Atomic Structure Calculations, (Englewood Cliffs, New Jersey: Prentice-Hall).
30. Johnson, K. H., and Pepper, S. V., 1982, J. appl. Phys., 53, 6634.
31. Kasowski, R. V., Ohuchi, F. S., and French, R. H., 1988, Physica, 150, 44.
32. Kruse, C., Finnis, M. W., Milman, V. Y., Payne, M. C., De Vita, A., and Gillan, M. J., 1994, J. Am. Ceram. Soc., 11, 431.
33. Kurata, H., Lefevre, E., Colliex, C., and Brydson, R., 1993, Phys. Rev. B, 47, 13 763.
34. Leapman, R. D., Grünes, L. A., and Fejes, P. L., 1982, Phys. Rev. B, 26, 614.
35. Loucks, T. L., 1967, Augmented Plane Wave Method, (New York: Benjamin).
36. Mattheiss, L., 1964, Phys. Rev., A, 133, 1399.
37. Möbus, G., 1996, Ultramicroscopy, 65, 205.
38. Möbus, G., and Dehm, G., 1996, Ultramicroscopy, 65, 217.
39. Möbus, G., Schuhman E., Dehm, G., and Rühle, M., 1995, Phys. Stat. Sol. (a), 77, 77.
40. MÜllejans, H., and Bruley, J., 1994, Ultramicroscopy, 53, 351.
41. MÜllejans, H., and Bruley, J., 1995, Microscopy, 180, 12.
42. Nath K., and Anderson, A. B., 1989, Phys. Rev. B, 39, 1013.
43. Okamoto, J. K., Pearson, D. H., Ahn, C. C., and Fultz, B., 1992, Applications of Transmis-sion Electron Energy-Loss Spectroscopy in Materials Science, edited by M. M. Disko, C. C. Ahn and B. Fultz (Warrendale, Pennsylvania: Metallurgical Society of AIME).
44. Pearson, D. H., and Ahn, C. C., Fultz, B., 1993, Phys. Rev. B, 47, 8471.
45. Pearson, D. H., Fultz, B., and Ahn, C. C., 1988, Appl. Phys. Lett., 53, 1405.
46. Pendry, J. B., 1974, Low Energy Electron Diffraction, (New York: Wiley-Interscience).
47. Phillipp, F., Höschen, R., Osaki, M., Möbus, G., and Rühle, M., 1994, Ultramicroscopy, 56, 1.
48. Reimer, L., 1989, Transmission Electron Microscopy (Berlin: Springer).
49. Rez, P., 1992, Applications of Transmission Electron Energy-Loss Spectroscopy in Materials Science, edited by M. M. Disko, C. C. Ahn, and B. Fultz Chapter 5 (Warrendale, Pennsylvania: Metallurgical Society of AIME) Chapter 5.
50. Sauer, H., Brydson, R., Rowley, P., Engel, W., Thomas, J. M., and Zeitler, E., 1993, Ultramicroscopy, 49, 198.
51. Scheu, C., Dehm, G., MÜllejans, H., Brydson, R., and Rühle, M., 1995, Microsc. Microanal. Microstruct., 6, 19.
52. Scheu, C., Dehm, G., MÜllejans, H., and Rühle, M., 1996, Mater. Sei. Forum, 207-209, 181.
53. Strecker, A., Salzberger, U., and Mayer, J., 1993, Prakt. Metallogr., 30, 482.
54. Vvedensky, D. D., Saldin, D. K., and Pendry, J. B., 1986, Comput. Phys. Commun., 40, 421.
55. Wallis, D. J., Gaskell, P. H., and Brydson, R., 1993, Inst. Phys. Conf. Ser., 138, 47.
56. Wallis, D. J., Gaskell, P. H., and Brydson, R., 1995, J. Microsc., 180, 307.
57. Weng, X., and Rez, P., 1988, Phys. Rev. B, 39, 7405.
58. Wille L. T., Durham P. J., and Sterne, P. A., 1986, J. Phys., Paris, C8, 43.
59. Wyckoff, R. W. G., 1960, Crystal Structures (New York: Wiley).
60. Zhao, G. L., Smith, J. R., Raynolds, J., and Srolovitz, D. J., 1996, Interface Sei., 3, 289.