Orientation sensitive EELS-analysis of boron nitride nanometric hollow spheres

Micron

Volumn 29, Issue 6, 1998, Pages 419-424

  Souche, C ^a   Jouffrey, B ^a   Hug, G ^b   Nelhiebel, M ^c  

^a ECOLE CENTRALE PARIS   (France)

^b Centre National de la Recherche Scientifique   (France)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

EELS; Hexagonal boron nitride; Transmission electron microscopy

Indexed keywords

EID: 0032468559     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(98)00030-4     Document Type: Article

References (11)

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