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Volumn 92, Issue 2, 2002, Pages 47-56
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Improved background-fitting algorithms for ionization edges in electron energy-loss spectra
a
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Author keywords
Background fitting; Electron energy loss spectroscopy (EELS); Elemental analysis
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Indexed keywords
ALGORITHMS;
COMPUTER SOFTWARE;
CONCENTRATION (PROCESS);
EDGE DETECTION;
ELECTRONS;
IONIZATION;
LEAST SQUARES APPROXIMATIONS;
MICROWAVE SPECTROGRAPHS;
SPATIAL VARIABLES MEASUREMENT;
SPECTRUM ANALYSIS;
POWER-LAW BACKGROUNDS;
MICROSCOPIC EXAMINATION;
ALGORITHM;
ARTICLE;
CALCULATION;
COMPUTER PROGRAM;
ELECTRON ENERGY LOSS SPECTROSCOPY;
IONIZATION;
REGRESSION ANALYSIS;
ANGUILLIFORMES;
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EID: 0036289430
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(01)00155-3 Document Type: Article |
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Times cited : (40)
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References (33)
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