A fuzzy logic approach to image analysis of HREM micrographs of III-V compounds

Ultramicroscopy

Volumn 66, Issue 1-2, 1996, Pages 73-88

  Hillebrand, R ^a   Werner, P ^a   Hofmeister, H ^a   Gosele U ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; ELECTRON MICROSCOPY; ELECTRON SCATTERING; FUZZY SETS; IMAGE ANALYSIS; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MORPHOLOGY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

CHEMICAL MAPPING;

CRYSTALLINE MATERIALS;

GADOLINIUM ARSENIDE; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL; ELECTRON MICROSCOPY; MATERIAL STATE; STRUCTURE ANALYSIS;

EID: 0030292251     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00081-2     Document Type: Article

References (25)

1. [1] A. Ourmazd, F.H. Baumann, M. Bode and Y. Kim, Ultramicroscopy 34 (1990) 237.
2. [2] P. Schwander, C. Kisielowski, M. Seibt and F.H. Baumann, Y. Kim and A. Ourmazd, Phys. Rev. Lett. 71 (1993) 4150.
3. [3] A.F. De Jong and D. Van Dyck, Ultramicroscopy 33 (1990) 269.
4. [4] S. Thoma and H. Cerva, Ultramicroscopy 35 (1991) 77.
5. [5] T. Walther, D. Gerthsen, R. Carius, A. Förster and K. Urban, in: Microscopy of Semiconducting Materials, Oxford, 1993, Inst. Phys. Conf. Ser. Vol. 134, (1993) p. 449.
6. [6] C.-Y. Tyan and P.P. Wang, Proc. 2nd IEEE Conf. on Fuzzy Systems, San Francisco (1993) p. 660.
7. [7] L.A. Zadeh, Fuzzy sets, Inform. and Control 8 (1965) 338.
8. [8] H.-J. Zimmermann, Fuzzy Set Theory and Its Applications 2nd rev. ed. (Kluwer Academic Publishers, Dordrecht, 1991).
9. [9] T.Y. Tan, U. Gösele and S. Yu. Crit. Rev. Solid State Mater. Sci. 17 (1991) 47.
10. [10] D. Stenkamp and W. Jäger, Ultramicroscopy 50 (1993) 321.
11. [11] P. Stadelmann, Ultramicroscopy 2 (1987) 131.
12. [12] A. Ourmazd, Mater. Sic. Rep. 9 (1993) 201.
13. [13] R. Hillebrand and H. Hofmeister, Phys. Stat. Sol. (a) 150 (1995) 65.
14. [14] E. Diday and J.C. Simon. Digital Pattern Recognition, Ed. K.S. Fu (Springer, Berlin. 1976) p. 51.
15. [15] R. Hillebrand, H. Hofmeister, P. Werner and U. Gösele, Appl. Phys. Lett. 67 (1995) 1763.
16. [16] C. Kisielowski, P. Schwander, F.H. Baumann, M. Seibt, Y. Kim and A. Ourmazd, Ultramicroscopy 58 (1995) 131.
17. [17] R. Hillebrand, P. Werner. H. Hofmeister and U. Gösele, in: Microscopy of Semiconducting Materials, Oxford, 1995, Inst. Phys. Conf. Ser. Vol. 146, (1995) p. 57.
18. [18] M. Seraphin, Neuronale Netze und Fuzzy-Logik (Franzis', München, 1994).
19. [19] W. Pedrycz, Fuzzy Control and Fuzzy Systems 2nd extended ed. (Wiley, New York, 1993).
20. [20] G.J. Klir and B. Yuan, Fuzzy Sets and Fuzzy Logic: Theory and Applications (Prentice-Hall, Englewood Cliffs, NJ, 1995).
21. [21] C.Y. Wang, Edge Detection Using Template Matching, Ph. D. Dissertation, Duke University (Michigan Dissertation Microfilm) (1985).
22. [22] R. Hillebrand, P. Wang and U. Gösele, Inform. Sci. Appl. 93 (1996) 321.
23. [23] J. Kahlert and H. Frank, Fuzzy-Logik und Fuzzy-Control (Vieweg, Braunschweig, 1993).
24. [24] R. Hillebrand and U. Gösele, in: Proc. 2nd Joint Conf. on Information Sciences Wrightsville Beach, NC (1995) p. 378.
25. [25] R. Hillebrand and U. Gösele, Inform. Sci. Appl., in press.