Quantitative atomic-scale analysis of interface structures: Transmission electron microscopy and local density functional theory

Physical Review Letters

Volumn 86, Issue 22, 2001, Pages 5066-5069

  Nufer, S ^a   Marinopoulos, A G ^a   Gemming, T ^a   Elsasser C ^a   Kurtz, W ^a   Kostlmeier S ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BAND STRUCTURE; CRYSTAL ATOMIC STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; PROBABILITY DENSITY FUNCTION; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

INELASTIC ELECTRON SCATTERING; LOCAL DENSITY FUNCTIONAL THEORY; PROJECTED DENSITIES OF STATES; QUANTITATIVE ATOMIC SCALE ANALYSIS; RHOMBOHEDRAL TWIN INTERFACE;

INTERFACES (MATERIALS);

EID: 0035962826     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.5066     Document Type: Article

References (20)

1. Fortran90 program for mixed-basis pseudopotential calculations for crystals