Nanobeam propagation and imaging in a FEGTEM/STEM

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 285-298

  Möbus, Günter ^a,c   Nufer, Stefan ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Ab initio calculations; Coherent CBED; Cs correction; Density of states; EELS; ELNES; Grain boundaries, Sapphire; Multislice method

Indexed keywords

COMPUTATIONAL METHODS; ELECTROMAGNETIC WAVE PROPAGATION; LIGHTING; PROBABILITY DENSITY FUNCTION; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION;

IMAGING TECHNIQUES;

AB INITIO CALCULATION; ANALYTIC METHOD; CONFERENCE PAPER; DENSITY; ELECTRON BEAM; ILLUMINATION; IMAGING SYSTEM; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037488184     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00094-9     Document Type: Conference Paper

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