Atomic-level detection by X-ray microanalysis in the analytical electron microscope

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 89-101

  Watanabe, M ^a   Williams, D B ^a  

^a Lehigh University   (United States)

Author keywords

Atomic level detection; X ray microanalysis

Indexed keywords

COPPER ALLOYS; ELECTRON GUNS; ENERGY DISPERSIVE SPECTROSCOPY; METAL FOIL; MICROANALYSIS; SPECTROMETRY;

ATOMIC LEVEL DETECTION; X RAY MICROANALYSIS;

ELECTRON MICROSCOPES;

ALLOY; COPPER; MANGANESE;

ATOM; CONFERENCE PAPER; ELECTRON BEAM; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; SIMULATION; THICKNESS; X RAY; X RAY MICROANALYSIS; X RAY SPECTROMETRY;

EID: 0032967702     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00015-7     Document Type: Conference Paper

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