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Volumn 80, Issue 2, 1999, Pages 125-131

Impact parameters for ionization by high-energy electrons

Author keywords

Inelastic electron scattering theory; X ray microanalysis

Indexed keywords

ATOMS; CONTINUUM MECHANICS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; IMPACT IONIZATION; NUMERICAL METHODS; X RAY ANALYSIS;

EID: 0033214184     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00102-3     Document Type: Article
Times cited : (12)

References (34)
  • 11
    • 0000242466 scopus 로고    scopus 로고
    • in: S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo (Eds.), VCH Verlagsgesellschaft mbH, Weinheim
    • S.J. Pennycook, in: S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo (Eds.), Handbook of Microscopy, Methods II, VCH Verlagsgesellschaft mbH, Weinheim, 1997, p. 595.
    • (1997) Handbook of Microscopy, Methods , vol.2 , pp. 595
    • Pennycook, S.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.