Tests on the validity of the atomic column approximation for STEM probe propagation

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 153-161

  Plamann, T ^a   Hytch M J ^a  

^a CNRS   (France)

Author keywords

Electron diffraction and elastic scattering theory; Image simulation; Scanning transmission electron microscopy

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON SCATTERING; ELECTRON TRAPS; SCANNING ELECTRON MICROSCOPY;

ATOMIC COLUMNS; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

TRANSMISSION ELECTRON MICROSCOPY;

CONFERENCE PAPER; ELECTRON; ELECTRON BEAM; ELECTRON DIFFRACTION; FOIL; IMAGE ANALYSIS; OPTICAL RESOLUTION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPE; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0345280055     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00019-4     Document Type: Conference Paper

References (11)

1. Van Dyck D., Op de Beeck M. Ultramicroscopy. 64:1996;99.
2. Hillyard S., Loane R.F., Silcox J. Ultramicroscopy. 49:1993;14.
3. Hillyard S., Silcox J. Ultramicroscopy. 52:1993;325.
4. Amali A., Rez P. Microsc. Microstruct. Microanal. 3:1997;28.
5. Nellist P.D., Pennycook S.J. J. Microsc. 190:1998;159.
6. Jesson D.E., Pennycook S.J. Proc. Roy. Soc. London A. 441:1993;261.
7. Jesson D.E., Pennycook S.J. Proc. Roy. Soc. London A. 449:1995;273.
8. J Treacy M.M., Gibson J.M. Ultramicroscopy. 52:1993;31.
9. Saxton W.O., Pitt T.J., Horner M. Ultramicroscopy. 4:1979;343.
10. Stadelman P.A. Ultramicroscopy. 21:1987;131.
11. Treacy M.M.J., Gibson J.M. J. Vac. Sci. Technol. B. 4:1986;1458.