Aberration correction results in the IBM STEM instrument

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 239-249

  Batson, P E ^a  

^a IBM RESEARCH   (United States)

Author keywords

Aberration correction; Electron microscopy; Quadrupole octupole corrector; Scanning transmission electron microscopy

Indexed keywords

ABERRATIONS; PROBES; STABILITY;

ABERRATION CORRECTION;

ACOUSTIC DEVICES;

ATOMIC PARTICLE; CONFERENCE PAPER; ELECTRON MICROSCOPE; ELECTRON PROBE MICROANALYSIS; METHODOLOGY; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037488183     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00091-3     Document Type: Conference Paper

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