Interband electronic structure of a near-Σ11 grain boundary in α-alumina determined by spatially resolved valence electron energy-loss spectroscopy

Journal of Physics D: Applied Physics

Volumn 29, Issue 7, 1996, Pages 1751-1760

  Müllejans, Harald ^a   French, Roger H ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ELECTRON TRANSITIONS; GRAIN BOUNDARIES; MATHEMATICAL MODELS; ULTRAVIOLET SPECTROSCOPY;

CRITICAL POINT MODELLING; INTERBAND TRANSITION STRENGTH; IONIC BONDING; SCANNING TRANSMISSION ELECTRON MICROSCOPE; VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY;

ELECTRONIC STRUCTURE;

EID: 0030190208     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/7/010     Document Type: Article

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