Fabrication and STEM/EELS measurements of nanometer-scale silicon tips and filaments

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 8, 1999, Pages 5641-5652

  Reed, B W ^a   Chen, J M ^a   Mac Donald, N C ^a   Silcox, J ^a   Bertsch, G F ^b  

^a School of Operations Research and Industrial Engineering   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000110098     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.5641     Document Type: Article

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