Relativistic ionisation cross sections for use in microanalysis

Ultramicroscopy

Volumn 68, Issue 1, 1997, Pages 25-41

  Knippelmeyer, Rainer ^a   Wahlbring, Petra ^b,c   Kohl, Helmut ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b KYOTO UNIVERSITY   (Japan)

^c Centre de Recherche Public   (Germany)

Author keywords

Analytical EM; EELS; Relativistic cross sections

Indexed keywords

MICROANALYSIS; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS; RELATIVISTIC CROSS-SECTIONS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; IMAGE PROCESSING; LIGHT SCATTERING; MAGNETIC FIELD; X RAY ANALYSIS;

EID: 0343907375     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00008-9     Document Type: Article

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