Detection of electron energy-loss edge shifts and fine structure variations at grain boundaries and interfaces

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 241-250

  Titchmarsh, J M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; EIGENVALUES AND EIGENFUNCTIONS; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; MOLYBDENUM; SEGREGATION (METALLOGRAPHY); SPECTRUM ANALYSIS; STAINLESS STEEL; STATISTICAL METHODS;

FINE STRUCTURES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CHROMIUM; IRON; MOLYBDENUM; STAINLESS STEEL;

CHEMICAL BINDING; CHEMICAL BOND; CONFERENCE PAPER; ELECTRON ENERGY LOSS SPECTROSCOPY; MULTIVARIATE ANALYSIS; STRUCTURE ANALYSIS; ULTRASTRUCTURE; X RAY SPECTROMETRY;

EID: 0032968461     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00024-8     Document Type: Conference Paper

References (15)

1. Krivanek O.L., Ahn C.C., Keeney R.B. Ultramicroscopy. 22:1987;103.
2. Gubbens A.J., Krivanek O.L. Ultramicroscopy. 51:1993;146.
3. Muller D.A., Singh D.J., Silcox J. Phys. Rev. B 57:1998;8181.
4. Splinter S.J., Bruley J., Smith D.A. Etz E.S. Microbeam Analysis. 1995;253 VCH Publishers, New York.
5. Brun N., Colliex C., Suenaga K., Tence M., Bonnet N. Bailey G.W., Dimlich R.V.W., Alexander K.B., McCarthy J.J., Pretlow T.P. Microscopy and Microanalysis. 1997;939 Springer, New York.
6. Anderson I.M., Bentley J. Bailey G.W., Dimlich R.V.W., Alexander K.B., McCarthy J.J., Pretlow T.P. Microscopy Microanalysis. 1997;931 Springer, New York.
7. Titchmarsh J.M., Dumbill S. J. Microsc. 184:1996;195.
8. Titchmarsh J.M., Dumbill S. J. Microsc. 188:1997;224.
9. Tence M., Quartuccio M., Colliex C. Ultramicroscopy. 58:1995;42.
10. Trebbia P., Bonnet N. Ultramicroscopy. 34:1990;165.
11. Cattell R.B. Multivariate Behav. Res. 1:1968;245.
12. Titchmarsh J.M., Dumbill S., Vatter I.A. Etz E.S. Proceedings of the 29th Annual Conf. MAS, Breckenridge, Colorado. 1995;259 VCH Publishers, New York.
13. Bonnet N. J.Microsc. 190:1998;2.
14. Pearson D.H., Ahn C.C., Fultz B. Phys. Rev. B 47:1993;8471.
15. Ozkaya D., Yuan J., Brown L.M. Electron microscopy and analysis 1995. Cherns D. IoP Conference Series No. 147. 1995;345 IoP, Bristol and Philadelphia.