Quantification of elemental segregation to lath and grain boundaries in low-alloy steel by STEM X-ray mapping combined with the ζ-factor method

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 94, Issue 3, 2003, Pages 307-316

  Watanabe, M ^a   Williams, D B ^a  

^a Lehigh University   (United States)

Author keywords

Boundary coverage; Minimum mass fraction; Quantitative X ray microanalysis; Spatial resolution

Indexed keywords

AUSTENITE; GRAIN BOUNDARIES; LEAST SQUARES APPROXIMATIONS; MICROANALYSIS; MICROSTRUCTURE; NUMERICAL METHODS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELEMENTAL SEGREGATION; LOW-ALLOY STEEL; QUANTITATIVE X-RAY MICROANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; X-RAY MAPPING;

STEEL;

EID: 0242443288     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.030307     Document Type: Article

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