Structural and electronic characterization of a dissociated dislocation in GeSi

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 24, 2000, Pages 16633-16641

  Batson, P ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000196707     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.16633     Document Type: Article

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