Advances in energy-filtering transmission electron microscopy

Journal of Electron Microscopy

Volumn 50, Issue 6, 2001, Pages 509-515

  Sigle, Wilfried ^a   Zern, Achim ^a   Hahn, Kersten ^a   Eigenthaler, Ulrike ^a   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Aberration correction; Amorphous materials; Bond mapping; Electron diffraction; Energy filtering transmission electron microscopy (EFTEM); Reduced density function

Indexed keywords

CONFERENCE PAPER;

ABERRATIONS; AMORPHOUS MATERIALS; CHEMICAL BONDS; ELECTRON DIFFRACTION; ELECTRONS; MAPPING;

ABERRATION CORRECTION; BOND MAPPING; CHEMICAL BONDINGS; ENERGY; ENERGY FILTERING; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPY; NEW ENERGIES; REDUCED DENSITY FUNCTION; TRANSMISSIVITY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035572909     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.6.509     Document Type: Conference Paper

References (20)

1. Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscope
2. Automatic structure factor measurement by convergent-beam electron diffraction
3. Determination of structure factors, lattice strains and accelerating voltage by energy-filtered CBED
4. Structure factor of amorphous germanium by quantitative electron diffraction
5. Acceptance of imaging energy filters
6. Test and improved design of a corrected imaging magnetic energy filter
7. Synthesis and thermal behavior of novel Si-B-C-N ceramic precursors
8. Investigations into the structural evolution of amorphous Si-C-N ceramics from precursors
9. 4/SiC ceramics
10. Specimen preparation for transmission electron microscopy: Reliable method for cross-sections and brittle materials
11. Precursor-derived covalent ceramics
12. New materials in the system Si-(N,C)-B and their characterization
13. A silicoboron carbonitride ceramic stable to 2000 degrees C
14. Chemical bond mapping of carbon by image-spectrum EELS in the second derivative mode
15. Electron diffraction analysis of polycrystalline and amorphous thin films
16. Reduced density function analysis using convergent electron illumination and iterative blind deconvolution
17. Influence of secondary phase chemistry on grain-boundary film thickness in siliconnitride
18. On the equilibrium thickness of intergranular glassy phases in ceramic materials